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119800711989.pdf論文内容の要旨199.56 kBAdobe PDFView/Open
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119800731989.pdf博士論文全文9.67 MBAdobe PDFView/Open
Title: DEVELOPMENT DESIGN OF BUILT-IN SELF-TEST FOR LSI CIRCUITS: TEST PATTERN GENERATION, OSCILLATION-BASED TESTING, AND CALIBRATION TECHNIQUE
Authors: 橘, 昌良
WANNABOON, Chatchai
Issue Date: Sep-2018
Publisher: 高知工科大学
Type: Thesis or Dissertation
URI: http://hdl.handle.net/10173/1989
Academic Degrees and number: 26402甲第341号
Degree-granting date: 2018-09-25
Degree name: 博士(学術)
Degree-granting institutions: 高知工科大学
Appears in Collections:学位論文(博士)

Please use this identifier to cite or link to this item: http://hdl.handle.net/10173/1989

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