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119800111984.pdf論文内容の要旨205.33 kBAdobe PDFView/Open
119800121984.pdf審査結果の要旨190.22 kBAdobe PDFView/Open
Title: Control of Interfacial and Bulk Defects in In–Ga–Zn–O Thin-Film Transistors toward Flexible Electronics
Authors: 古田, 守
AMAN, S G Mehadi
Issue Date: Sep-2018
Publisher: 高知工科大学
Type: Thesis or Dissertation
URI: http://hdl.handle.net/10173/1984
Academic Degrees and number: 26402甲第336号
Degree-granting date: 2018-09-25
Degree name: 博士(工学)
Degree-granting institutions: 高知工科大学
Appears in Collections:学位論文(博士)

Please use this identifier to cite or link to this item: http://hdl.handle.net/10173/1984

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