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Title: The Structural Characterisation of Risk in the R&D Process of Functional Raw Materials for Electronic Devices
Authors: Chikamori, Yoji
Nasu, Seigo
Issue Date: Jul-2017
Publisher: Society for Social Management Systems
Journal Title: Society for Social Management Systems Internet Journal
Volume: 10
Issue: 2
Abstract: The electronic materials and electronics device industries remain important to Japan in spite of the general decline of the Japanese electronics industry. There is risk and uncertainty when developing functional materials in the electronics industry. However, studies examining the uncertainty and risk variables in the development of functional materials are scarce. This study examines incremental research and development (R&D) developed for raw functional materials for electronics. Our analysis suggests that, as a result of R&D and later industrialisation, the dominant variables are the scientific limits and the uncertainty of the object, an impossible production condition and unknowable marketability.
Type: Conference Paper
URI: http://hdl.handle.net/10173/1858
Appears in Collections:Vol.10(2)

Please use this identifier to cite or link to this item: http://hdl.handle.net/10173/1858

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