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Browsing by Author SAN-UM, Wimol

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Issue DateTitleAuthor(s)Journal Name
Sep-2010Developments of Built-In Self Test and Calibration of Analog Mixed-Signal LSI for Catastrophic Failures and Parametric Variations橘, 昌良; SAN-UM, Wimol-
1-Jan-2010Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 StandardSAN-UM, Wimol; TACHIBANA, MasayoshiIEICE Transactions on Information and Systems
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