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Browsing by Author Hirao, Takashi

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Issue DateTitleAuthor(s)Journal Name
Nov-2010Analysis of Hump Characteristics in Thin-Film Transistors with ZnO Channels Deposited by Sputtering at Various Oxygen Partial PressuresFuruta, Mamoru; Kamada, Yudai; Kimura, Mutsumi; Hiramatsu, Takahiro; Matsuda, Tokiyoshi; Furuta, Hiroshi; Li, Chaoyang; Fujita, Shizuo; Hirao, TakashiIEEE Electron Device Letters
10-Mar-2011Effects of chemical stoichiometry of channel region on bias instability in ZnO thin-film transistorsKamada, Yudai; Fujita, Shizuo; Kimura, Mutsumi; Hiramatsu, Takahiro; Matsuda, Tokiyoshi; Furuta, Mamoru; Hirao, TakashiAplied Physics Letters
Jun-2012Electrical Properties of the Thin-Film Transistor With an Indium–Gallium–Zinc Oxide Channel and an Aluminium Oxide Gate Dielectric Stack Formed by Solution-Based Atmospheric Pressure DepositionFuruta, Mamoru; Kawaharamura, Toshiyuki; Wang, Depang; Toda, Tatsuya; Hirao, TakashiIEEE Electron Device Letters
10-Oct-2010Mechanism analysis of photoleakage current in ZnO thin-film transistors using device simulationKimura, Mutsumi; Kamada, Yudai; Fujita, Shizuo; Hiramatsu, Takahiro; Matsuda, Tokiyoshi; Furuta, Mamoru; Hirao, TakashiAplied Physics Letters
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